Track sensitivity and the surface roughness measurements of CR-39 with atomic force microscope

Atomic Force Microscope (AFM) has been applied to evaluate the surface roug hness and the track sensitivity of CR-39 track detector. We experimentally confirmed the inverse correlation between the track sensitivity and the rou ghness of the detector surface after etching. The surface of CR-39 (CR-39 d oped with antioxidant (HARZLAS (TD-1)) and copolymer of CR-39/NIPAAm (TNF-1 )) with high sensitivity becomes rough by the etching, while the pure CR-39 (BARYOTRAK) with low sensitivity keeps its original surface clarity even f or the long etching.