Piezoresistive effect in p-type polycrystalline diamond films

Citation
L. Fang et al., Piezoresistive effect in p-type polycrystalline diamond films, SCI CHINA A, 42(7), 1999, pp. 769-777
Citations number
15
Categorie Soggetti
Multidisciplinary
Journal title
SCIENCE IN CHINA SERIES A-MATHEMATICS PHYSICS ASTRONOMY
ISSN journal
10016511 → ACNP
Volume
42
Issue
7
Year of publication
1999
Pages
769 - 777
Database
ISI
SICI code
1001-6511(199907)42:7<769:PEIPPD>2.0.ZU;2-X
Abstract
The piezoresistive effect of boron-doped polycrystalline diamond films was analyzed and discussed by the famous M-S polycrystalline model. It is found that the valence bands splitting-off and the grain-boundary scattering are the main factors responsible for the piezoresistive effect in the p-type p olycrystalline diamond films. The gauge-factor calculation formula includin g the effect of both background scattering and grain-boundary scattering we re obtained, and the calculation results are in accordance with the experim ental results.