Correlation of electrical conductivity and other vigor tests with field emergence of soybean seedlings

Citation
Rd. Vieira et al., Correlation of electrical conductivity and other vigor tests with field emergence of soybean seedlings, SEED SCI T, 27(1), 1999, pp. 67-75
Citations number
27
Categorie Soggetti
Plant Sciences
Journal title
SEED SCIENCE AND TECHNOLOGY
ISSN journal
02510952 → ACNP
Volume
27
Issue
1
Year of publication
1999
Pages
67 - 75
Database
ISI
SICI code
0251-0952(1999)27:1<67:COECAO>2.0.ZU;2-P
Abstract
Seeds from six soybean cultivars (Cristalina, IAC 31-Foscarin, IAC-15, UFV- 10, IAC-14 and IAS-5) and from five soybean cultivars (IAC 31-Foscarin, IAC -15, IAC-14, IAS-5 and Iguacu) were evaluated in 1993 and 1994, respectivel y, in terms of physiological seed quality by the mechanical damage (MD), st andard germination (SG), accelerated aging (AA), electrical conductivity (E C), and seedling field emergence (FE) tests. Significant correlations were detected between SG, AA and EC and FE. However, in terms of the cultivar or the year, the degree of association among these parameters can change base d on the environmental conditions of each year.