XPS characterization of nanosized overoxidized polypyrrole films on graphite electrodes

X-Ray photoelectron spectroscopy (XPS) analysis was used to verify the stru cture of nanosized overoxidized polypyrrole (OPPy) films that were grown on glassy carbon. The films were electrochemically grown to ca. 1.2-1.6 nm th ickness from acetonitrile with tetrabutylammonium perchlorate (TBAP) and fr om water with adenosine triphosphate (ATP) as dopant. The films have been p reviously characterized by electrochemical methods, but this represents the first study of the ultrathin films by XPS. XPS analysis verifies that the key structural features of nanosized OPPy films are the same as those of mu ch thicker films previously studied by XPS on metal substrates, where diffe rential charging effects are much less severe. Some differences between the microstructures of OPPy and OPPy/ATP films are highlighted by the results. In addition, XPS results confirm a two-domain model of the polymer films t hat has been proposed from previous studies of PPy and OPPy. The results sh ow that XPS can be used to characterize nanosized films on graphite, after correction for differential charging. Graphite represents a substrate of ch oice for the fabrication of permselective ultrathin membranes for biosensor s from materials such as OPPy.