Growth of SrTiO3 and BaTiO3 thin films by atomic layer deposition

Citation
M. Vehkamaki et al., Growth of SrTiO3 and BaTiO3 thin films by atomic layer deposition, EL SOLID ST, 2(10), 1999, pp. 504-506
Citations number
29
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
ELECTROCHEMICAL AND SOLID STATE LETTERS
ISSN journal
10990062 → ACNP
Volume
2
Issue
10
Year of publication
1999
Pages
504 - 506
Database
ISI
SICI code
1099-0062(199910)2:10<504:GOSABT>2.0.ZU;2-C
Abstract
SrTiO3 and BaTiO3 thin films were deposited by atomic layer deposition maki ng use of a novel class of strontium and barium precursors, i.e., their cyc lopentadienyl compounds, together with titanium tetraisopropoxide and water . SrTiO3 films were grown at 325 degrees C from strontium bis(triisopropylc yclopentadienyl) and BaTiO3 at 275 degrees C from barium bis(pentamethylcyc lopentadienyl). After annealing in air at 500 degrees C, permittivities of 180 and 165 were measured for SrTiO3 and BaTiO3, respectively. The films sh owed excellent conformality and complete filling of test trench structures. (C) 1999 The Electrochemical Society. S1099-0062(99)05-021-X. All rights r eserved.