Jh. Jang et Kh. Yoon, Preparation and electrical properties of sol-gel derived antiferroelectricPb-0.99[(Zr0.6Sn0.4)(0.96)Ti-0.04](0.98)Nb0.02O3 thin films, FERROELECTR, 225(1-4), 1999, pp. 999-1006
The antiferroelectric Pb-0.99[(Zr0.6Sn0.4)(0.96)Ti-0.04](0.98)Nb0.02O3 thin
films were prepared by a sol-gel process with different heat treatments. T
he films pyrolysed in the temperature range from 350 degrees C to 600 degre
es C for each spin-on layer, consisted of spherulitic grains (rosettes) and
fine pyrochlore phase around them. But for the thin films heat-treated at
700 degrees C, the rosettes clung to each other and the pyrochlore phase di
sappeared. The films heat-treated at 700 degrees C represented the highest
dielectric constants and spontaneous polarization values, and showed little
degradation in polarization up to 10(8) switching cycles.