Preparation and electrical properties of sol-gel derived antiferroelectricPb-0.99[(Zr0.6Sn0.4)(0.96)Ti-0.04](0.98)Nb0.02O3 thin films

Authors
Citation
Jh. Jang et Kh. Yoon, Preparation and electrical properties of sol-gel derived antiferroelectricPb-0.99[(Zr0.6Sn0.4)(0.96)Ti-0.04](0.98)Nb0.02O3 thin films, FERROELECTR, 225(1-4), 1999, pp. 999-1006
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
FERROELECTRICS
ISSN journal
00150193 → ACNP
Volume
225
Issue
1-4
Year of publication
1999
Pages
999 - 1006
Database
ISI
SICI code
0015-0193(1999)225:1-4<999:PAEPOS>2.0.ZU;2-B
Abstract
The antiferroelectric Pb-0.99[(Zr0.6Sn0.4)(0.96)Ti-0.04](0.98)Nb0.02O3 thin films were prepared by a sol-gel process with different heat treatments. T he films pyrolysed in the temperature range from 350 degrees C to 600 degre es C for each spin-on layer, consisted of spherulitic grains (rosettes) and fine pyrochlore phase around them. But for the thin films heat-treated at 700 degrees C, the rosettes clung to each other and the pyrochlore phase di sappeared. The films heat-treated at 700 degrees C represented the highest dielectric constants and spontaneous polarization values, and showed little degradation in polarization up to 10(8) switching cycles.