Tr. Chen et Tc. Hsia, SCHEDULING FOR IC SORT AND TEST FACILITIES WITH PRECEDENCE CONSTRAINTS VIA LAGRANGIAN-RELAXATION, Journal of manufacturing systems, 16(2), 1997, pp. 117-128
Citations number
19
Categorie Soggetti
Engineering, Manufacturing","Operatione Research & Management Science","Engineering, Industrial
This paper presents an effective scheduling algorithm for an integrate
d circuit (IC) test floor environment where wafer sort and final test
are performed. Two particular features of scheduling IC test floor fac
ilities are incorporated in this study: (1) Each job requires more tha
n one resource to be used simultaneously to process the job. The const
raints on each individual resource have to be dealt with. (2) Each job
needs to be processed through a number of operations with different t
emperatures in a specific order. Therefore, strict precedence constrai
nts on these operations have to be considered. In this paper, the sche
duling problem for IC test floor facilities is modeled as an integer,
programming problem and is solved using the Lagrangian relaxation tech
nique. Comparisons of results with those obtained from other heuristic
dispatching rules are also given.