New experimental data are presented on the thermal expansion of melts of ge
rmanium and silicon, and on changes in their density during crystallization
; these data are obtained by exposing samples to a narrow beam of gamma rad
iation. It is shown that the density polytherm of liquid germanium is nonli
near. The causes of this phenomenon are discussed. The electronic component
s of the density jumps for Ge and Si on the crystal-melt phase transition a
re estimated. The experimental results and the most reliable literature dat
a on the density of crystalline semiconductors are used to compile consiste
nt tables of the thermal properties of germanium and silicon in the solid a
nd liquid states in a wide temperature range from 0 to 1900 K (for Si) and
from 0 to 2275 K (for Ge).