Test and the product life cycle

Citation
T. Ambler et B. Bennetts, Test and the product life cycle, IEEE DES T, 16(3), 1999, pp. 20-22
Citations number
3
Categorie Soggetti
Computer Science & Engineering
Journal title
IEEE DESIGN & TEST OF COMPUTERS
ISSN journal
07407475 → ACNP
Volume
16
Issue
3
Year of publication
1999
Pages
20 - 22
Database
ISI
SICI code
0740-7475(199907/09)16:3<20:TATPLC>2.0.ZU;2-A