Board test and the product life cycle - Get wise to board test strategies

Authors
Sutton, B
Citation
B. Sutton, Board test and the product life cycle - Get wise to board test strategies, IEEE DES T, 16(3), 1999, pp. 28-33
Categorie Soggetti
Computer Science & Engineering
Journal title
IEEE DESIGN & TEST OF COMPUTERS
ISSN journal
07407475 → ACNP
Volume
16
Issue
3
Year of publication
1999
Pages
28 - 33
Database
ISI
SICI code
0740-7475(199907/09)16:3<28:BTATPL>2.0.ZU;2-D
Abstract
Most test strategies evolve in isolation to satisfy current objectives. The author suggests we take note of some of the significant industry trends an d change our thinking accordingly.