RF integration into CMOS and deep-submicron challenges

Authors
Svensson, C Soumyanath, K Kaiser, B Vasudev, PK Carley, LR Kalter, H Ackland, B
Citation
C. Svensson et al., RF integration into CMOS and deep-submicron challenges, IEEE DES T, 16(3), 1999, pp. 112-116
Categorie Soggetti
Computer Science & Engineering
Journal title
IEEE DESIGN & TEST OF COMPUTERS
ISSN journal
07407475 → ACNP
Volume
16
Issue
3
Year of publication
1999
Pages
112 - 116
Database
ISI
SICI code
0740-7475(199907/09)16:3<112:RIICAD>2.0.ZU;2-K