In vacuum circuit breakers the post-arc current caused by the remaining ion
s and electrons in the contact gap is an indication of the residual ionizat
ion and its decay. It coincides with the formation of a positive space char
ge sheath in front of the new cathode, which grows toward the new anode. In
a vacuum test chamber an are (1.5-15 kA RMS) is drawn between high-current
electrodes of the spiral type. At different times after current zero a tra
nsient recovery voltage is applied across a separate pair of high voltage e
lectrodes. In contrast to real circuit breakers, where the transient recove
ry voltage reappears between the arcing contacts, this separation allows th
e study of residual plasma free from the thermal stress and melting on the
contact surfaces. From the post-are current across these electrodes, in com
parison with a mathematical model of sheath growth, the density of the char
ge carriers can be evaluated. Such values and their temporal decay are pres
ented.