Step-stress life-testing with random stress-change times for exponential data

Citation
Cj. Xiong et Ga. Milliken, Step-stress life-testing with random stress-change times for exponential data, IEEE RELIAB, 48(2), 1999, pp. 141-148
Citations number
16
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON RELIABILITY
ISSN journal
00189529 → ACNP
Volume
48
Issue
2
Year of publication
1999
Pages
141 - 148
Database
ISI
SICI code
0018-9529(199906)48:2<141:SLWRST>2.0.ZU;2-0
Abstract
This paper studies statistical models in step-stress accelerated life-testi ng when the stress-change times are random. The marginal lifetime distribut ion of a test unit under a step-stress test plan when the stress change tim es are random variables is presented. Maximmum likelihood estimates for mod el parameters based on both the marginal and conditional life distributions are considered. An optimum test plan is explored for simple step-stress te st when the stress change time is an order statistic from the exponential l ifetime under the low-stress level.