Plasticization effect and the excitation of the electronic subsystem in anLiF single crystal by an ultraweak thermalized-neutron flux in the stress-relaxation regime

Authors
Lipson, AG Sakov, DM Savenko, VI Saunin, EI
Citation
Ag. Lipson et al., Plasticization effect and the excitation of the electronic subsystem in anLiF single crystal by an ultraweak thermalized-neutron flux in the stress-relaxation regime, JETP LETTER, 70(2), 1999, pp. 123-128
Citations number
20
Categorie Soggetti
Physics
Journal title
JETP LETTERS
ISSN journal
00213640 → ACNP
Volume
70
Issue
2
Year of publication
1999
Pages
123 - 128
Database
ISI
SICI code
0021-3640(19990725)70:2<123:PEATEO>2.0.ZU;2-I
Abstract
Plasticization is detected during stress relaxation in uniaxially loaded Li F single crystals irradiated with an ultraweak flux of thermalized neutrons (UFTN) with intensity I(n)similar to 100 neutrons/cm(2)s. It is shown that when loaded LiF samples are irradiated with an UFTN, excitation of the ele ctronic subsystem of the crystal is observed and is manifested in a stimula tion of deformation exoemission of electrons and the generation of F center s. (C) 1999 American Institute of Physics. [S0021-3640(99)01014-2].