Electron-beam irradiation-induced nonlinearity in silicate glass films andfabrication of nonlinear optical gratings

Citation
M. Nakanishi et al., Electron-beam irradiation-induced nonlinearity in silicate glass films andfabrication of nonlinear optical gratings, J APPL PHYS, 86(5), 1999, pp. 2393-2396
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
86
Issue
5
Year of publication
1999
Pages
2393 - 2396
Database
ISI
SICI code
0021-8979(19990901)86:5<2393:EINISG>2.0.ZU;2-Z
Abstract
Electron-beam (EB) irradiation on rf-sputtered silicate glass thin films ca n produce second-order nonlinearity. EB-poled germanosilicate glass film sh ows a maximum nonlinear optical (NLO) coefficient of d(33)=0.33 pm/V. It is found that the nonlinearity is homogeneous throughout the film layer and d epends on both the EB current and dose. Moreover, a NLO grating, i.e., chi( (2)) grating, is realized using a periodic EB writing technique. (C) 1999 A merican Institute of Physics. [S0021-8979(99)04217-6].