Stripping and cleaning of photoresist using low energy neutrals

Citation
Xm. Tang et al., Stripping and cleaning of photoresist using low energy neutrals, J APPL PHYS, 86(5), 1999, pp. 2419-2424
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
86
Issue
5
Year of publication
1999
Pages
2419 - 2424
Database
ISI
SICI code
0021-8979(19990901)86:5<2419:SACOPU>2.0.ZU;2-G
Abstract
Experimental studies of a broad-area hyperthermal neutral stream source for photoresist cleaning are reported. Low energy neutrals are generated from a high-density inductively coupled plasma by the surface reflection neutral ization method. Rates of removal of photoresist polymers such as polymethyl methacrylate as functions of the hyperthermal translational energy and bac kground neutral pressure are reported. The results demonstrate this low ene rgy neutral source provides controllable fast neutrals for cleaning applica tions. Ex situ and in situ measurements yield typical removal rates of abou t 10 Angstrom/s without stream collimation. The removal rates at increasing pressures show a trade-off between creating higher density plasma, leading to a greater initial neutral flux and attenuation of neutrals due to colli sions. These observations are in good agreement with previous Monte Carlo s imulations. The removal rate increases linearly with rf power and is nearly constant as the neutral energy is varied by varying the reflector bias. On e consequence of neutral directionality in collimated stream applications i s the presence of unremoved carbon compounds on the sidewalls as indicated by angle-resolved x-ray photoelectron spectroscopy. (C) 1999 American Insti tute of Physics. [S0021-8979(99)07117-0].