Global modeling of a dielectric barrier discharge in Ne-Xe mixtures for analternating current plasma display panel

Citation
Y. Ikeda et al., Global modeling of a dielectric barrier discharge in Ne-Xe mixtures for analternating current plasma display panel, J APPL PHYS, 86(5), 1999, pp. 2431-2441
Citations number
26
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
86
Issue
5
Year of publication
1999
Pages
2431 - 2441
Database
ISI
SICI code
0021-8979(19990901)86:5<2431:GMOADB>2.0.ZU;2-J
Abstract
A global model of a dielectric barrier discharge in Ne-Xe mixtures for an a lternating current plasma display panel was developed. This model was used to evaluate electron temperature, plasma density, densities of excited stat e atoms, wall charge density, current density, excimer density, and vacuum ultraviolet (VUV) intensity, and their gas composition-pressure dependencie s, in order to analyze the mechanism of VUV radiation and discharge efficie ncy. The results show that the intensity ratio of 173 to 147 nm VUV is abou t a few percent. This means that the contribution of excimers is small in t erms of VUV radiation. The maximum discharge efficiency was about 9% for Xe fraction in the range of 2%-12% and gas pressure in the range of 100-600 T orr. Discharge efficiency increases in the high Xe fraction and gas pressur e region. The increase of the discharge efficiency is attributed to a decre ase of discharge current and an increase of Xe-r(*)(P-3(1)) excited state a tom, due to the low electron temperature in the high Xe fraction and gas pr essure region. (C) 1999 American Institute of Physics. [S0021-8979(99)08917 -3].