Y. Ikeda et al., Global modeling of a dielectric barrier discharge in Ne-Xe mixtures for analternating current plasma display panel, J APPL PHYS, 86(5), 1999, pp. 2431-2441
A global model of a dielectric barrier discharge in Ne-Xe mixtures for an a
lternating current plasma display panel was developed. This model was used
to evaluate electron temperature, plasma density, densities of excited stat
e atoms, wall charge density, current density, excimer density, and vacuum
ultraviolet (VUV) intensity, and their gas composition-pressure dependencie
s, in order to analyze the mechanism of VUV radiation and discharge efficie
ncy. The results show that the intensity ratio of 173 to 147 nm VUV is abou
t a few percent. This means that the contribution of excimers is small in t
erms of VUV radiation. The maximum discharge efficiency was about 9% for Xe
fraction in the range of 2%-12% and gas pressure in the range of 100-600 T
orr. Discharge efficiency increases in the high Xe fraction and gas pressur
e region. The increase of the discharge efficiency is attributed to a decre
ase of discharge current and an increase of Xe-r(*)(P-3(1)) excited state a
tom, due to the low electron temperature in the high Xe fraction and gas pr
essure region. (C) 1999 American Institute of Physics. [S0021-8979(99)08917
-3].