Crystallographically engineered BaTiO3 single crystals for high-performance piezoelectrics

Citation
Se. Park et al., Crystallographically engineered BaTiO3 single crystals for high-performance piezoelectrics, J APPL PHYS, 86(5), 1999, pp. 2746-2750
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
86
Issue
5
Year of publication
1999
Pages
2746 - 2750
Database
ISI
SICI code
0021-8979(19990901)86:5<2746:CEBSCF>2.0.ZU;2-L
Abstract
Dielectric and piezoelectric properties of BaTiO3 single crystals polarized along the < 001 > crystallographic axes were investigated as a function of temperature and dc bias. Electromechanical coupling (k(33))similar to 85% and piezoelectric coefficients (d(33))similar to 500 pC/N, better or compar able to those of lead-based Pb(Zr, Ti)O-3 (PZT), were found from < 001 >-or iented orthorhombic crystals at 0 degrees C, as a result of crystallographi c engineering. A rhombohedral BaTiO3 crystal polarized along < 001 > also e xhibited enhanced piezoelectric performance, i.e., k(33)similar to 79% and d(33)similar to 400 pC/N at -90 degrees C, superior to PZTs at the same tem perature. It was found that the crystal structure determined the (in)stabil ity of the engineered domain state in BaTiO3 single crystals. Rhombohedral (3m) crystals at -100 degrees C exhibited a stable domain configuration, wh ereas depoling occurred in crystals in the adjacent orthorhombic phase upon removal of the E field. (C) 1999 American Institute of Physics. [S0021-897 9(99)04517-X].