Dielectrophoretic collection rates have been used to measure the dielectric
properties of particles. For accurate collection-rate measurements it is i
mportant to be able to discriminate between particles collecting on an elec
trode and particles that are in the bulk solution. In this paper we demonst
rate how evanescent-imaging methods can be used to observe only those parti
cles that are in the plane of the electrode array, so that significant impr
ovements in the signal-to-noise ratio compared with conventional imaging me
thods are achieved.