E. Sokell et al., On the measurement of electron impact ionisation cross-sections for highlycharged ions using an electron beam ion trap (EBIT), PHYS SCR, T80B, 1999, pp. 289-291
Experiments in which the time evolution of the charge distribution of Argon
ions in the Tokyo EBIT was measured have been carried out. These measureme
nts involved extracting the ions from the trap after a controlled confineme
nt time and determining the charge distribution of these ions. By repeating
the procedure at various confinement times the onsets for ions of particul
ar charge states were determined at a series of electron beam energies. Thi
s sort of data should permit electron impact ionisation cross-sections to b
e determined as well as providing interesting information relating to EBIT
physics.