Precision X-ray spectroscopy at the NIST electron-beam ion trap: Resolution of major systematic error

Citation
Ct. Chantler et al., Precision X-ray spectroscopy at the NIST electron-beam ion trap: Resolution of major systematic error, PHYS SCR, T80B, 1999, pp. 440-442
Citations number
14
Categorie Soggetti
Physics
Journal title
PHYSICA SCRIPTA
ISSN journal
02811847 → ACNP
Volume
T80B
Year of publication
1999
Pages
440 - 442
Database
ISI
SICI code
0281-1847(1999)T80B:<440:PXSATN>2.0.ZU;2-2
Abstract
Some of the most critical tests of the QED Lamb shifts are currently being pursued in the X-ray regime by investigating the core levels of medium Z at oms such as vanadium. Toe current approach to the measurement of the Lamb s hift in such a system is outlined. We present major progress in understandi ng and reducing the systematic errors within our system. The error budget h as been reduced to a level where critical tests of QED can be performed. Re cent observations of Lyman a in hydrogenic vanadium at the NIST Electron-Be am Ion Trap are presented.