Electron beam assisted extraction of highly charged ions from an ECRIS

Authors
Runkel, S Hohn, O Schmidt, L Stiebing, KE Schmidt-Bocking, H Schempp, A Becker, R
Citation
S. Runkel et al., Electron beam assisted extraction of highly charged ions from an ECRIS, PHYS SCR, T80B, 1999, pp. 507-508
Citations number
5
Categorie Soggetti
Physics
Journal title
PHYSICA SCRIPTA
ISSN journal
02811847 → ACNP
Volume
T80B
Year of publication
1999
Pages
507 - 508
Database
ISI
SICI code
0281-1847(1999)T80B:<507:EBAEOH>2.0.ZU;2-1
Abstract
A new concept to assist the extraction and to improve the quality of highly charged ion beams from an electron cyclotron resonance ion source (ECRIS) is the injection of an intense and well focused electron beam from the extr action side into the plasma of the ion source [1]. A first test setup and f irst results have been presented elsewhere [2]. in this article an improved setup and new results are presented.