Hollow atom dynamics on thin films

We present a new series of experiments on the interaction of highly charged ions with thin films. The main goal concerns the investigation of the inte rplay between the projectile and the surface electronic structure. The dyna mics of the hollow atom is analyzed through high-resolution Auger electron spectroscopy. LiF and C-60 thin films have been investigated; the results f rom LiF permit definite conclusion on the respective role of the band gap a nd the binding energy in bulk LIF during the projectile neutralization and relaxation. Results from C-60 raise new questions on the actual nature of t he processes responsible for the fast filling of the projectile L-shell.