Preparation and characterization of doped polyaniline films

Citation
Lh. Huo et al., Preparation and characterization of doped polyaniline films, THIN SOL FI, 350(1-2), 1999, pp. 5-9
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
350
Issue
1-2
Year of publication
1999
Pages
5 - 9
Database
ISI
SICI code
0040-6090(19990815)350:1-2<5:PACODP>2.0.ZU;2-M
Abstract
Stable monolayer of the polyaniline doped with camphor sulfonic acid at the air-water interface has been obtained, of which multilayers have been succ essfully deposited by Langmuir-Blodgett technique onto CaF2 substrate. The limiting mean molecular area and collapse pressure are found to be 0.294 nm (2) and 41 mN/m, respectively. The multilayers were characterized by IR and W-Vis-NIR spectroscopies. X-ray small-angle diffraction data show that the multilayer was periodic layer structure with the layer spacing of 1.60 nm. The comparisons are also made with characterization of the casting film. ( C) 1999 Elsevier Science S.A. All rights reserved.