The influence of post-deposition treatment on the physical properties of CdTe films deposited by stacked elemental layer processing

Citation
Lr. Cruz et al., The influence of post-deposition treatment on the physical properties of CdTe films deposited by stacked elemental layer processing, THIN SOL FI, 350(1-2), 1999, pp. 44-48
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
350
Issue
1-2
Year of publication
1999
Pages
44 - 48
Database
ISI
SICI code
0040-6090(19990815)350:1-2<44:TIOPTO>2.0.ZU;2-V
Abstract
Cadmium telluride thin films have been deposited on glass and glass/SnO2/Cd S substrates using the stacked elemental layer (SEL) technique. After the f ilms were deposited, they were subjected to the conventional heat treatment in the presence of a CdCl2/methanol solution. The samples were analyzed, b efore and after treatment, by X-ray diffraction, atomic force microscopy, c athodoluminescence and energy dispersive X-ray spectrometry. The results su ggest that the treatment promotes grain growth, decreases defect concentrat ion, and gives rise to the formation of a CdTe1-xSx solid solution, which r eplaces the CdTe original layer. The existence of this solid solution was e videnced by a reduction in the lattice parameter relative to untreated samp les and confirmed by EDS analysis of treated and untreated glass/SnO2/CdS/C dTe structures. (C) 1999 Elsevier Science S.A. All rights reserved.