Low manganese steel samples were yttrium implanted using ion implantation t
echnique. Sample compositions and structures were investigated before and a
fter yttrium implantations to determine the yttrium distribution in low man
ganese steel. Yttrium implantation depth profiles were characterized using
conventional techniques such as X-ray photoelectron spectroscopy (XPS), ref
lection high energy electron diffraction (RHEED)I X-ray diffraction (XRD),
glancing angle X-ray diffraction (GAXRD) and a nuclear analytical method: R
utherford backscattering spectroscopy (RBS). The aim of this study is to sh
ow that correlation between composition and structural analyses allows to u
nderstand the effect of implanting yttrium in low manganese steel. (C) 1999
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