Elaboration and characterization of yttrium implanted low manganese steel.

Citation
E. Caudron et al., Elaboration and characterization of yttrium implanted low manganese steel., THIN SOL FI, 350(1-2), 1999, pp. 168-172
Citations number
22
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
350
Issue
1-2
Year of publication
1999
Pages
168 - 172
Database
ISI
SICI code
0040-6090(19990815)350:1-2<168:EACOYI>2.0.ZU;2-B
Abstract
Low manganese steel samples were yttrium implanted using ion implantation t echnique. Sample compositions and structures were investigated before and a fter yttrium implantations to determine the yttrium distribution in low man ganese steel. Yttrium implantation depth profiles were characterized using conventional techniques such as X-ray photoelectron spectroscopy (XPS), ref lection high energy electron diffraction (RHEED)I X-ray diffraction (XRD), glancing angle X-ray diffraction (GAXRD) and a nuclear analytical method: R utherford backscattering spectroscopy (RBS). The aim of this study is to sh ow that correlation between composition and structural analyses allows to u nderstand the effect of implanting yttrium in low manganese steel. (C) 1999 Elsevier Science S.A. All rights reserved.