Controlled nanometer-scale surface roughening and its effect on the ordering and stability of liquid-crystalline polymer films

Citation
Mwj. Van Der Wielen et al., Controlled nanometer-scale surface roughening and its effect on the ordering and stability of liquid-crystalline polymer films, ADVAN MATER, 11(11), 1999, pp. 918
Citations number
17
Categorie Soggetti
Multidisciplinary,"Material Science & Engineering
Journal title
ADVANCED MATERIALS
ISSN journal
09359648 → ACNP
Volume
11
Issue
11
Year of publication
1999
Database
ISI
SICI code
0935-9648(19990803)11:11<918:CNSRAI>2.0.ZU;2-G
Abstract
Communication: Control over surface texture in thin film production is nece ssary for preparing smooth films (e.g., for optical surfaces), but also whe re some roughening of the surface is required (e.g., patterning for liquid- crystalline display devices). These authors have found a way to control nan oscale roughening by adsorbing negatively charged colloidal silica particle s onto a positively charged polyelectrolyte preadsorbed onto a silicon wafe r. Using this method, model surfaces have been prepared which are then subs trates for liquid-crystalline polymers. The properties of these films (surf ace ordering and film stability) are compared with their smooth counterpart s.