Field-emission studies of smooth and nanostructured carbon films

Citation
Vi. Merkulov et al., Field-emission studies of smooth and nanostructured carbon films, APPL PHYS L, 75(9), 1999, pp. 1228-1230
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
75
Issue
9
Year of publication
1999
Pages
1228 - 1230
Database
ISI
SICI code
0003-6951(19990830)75:9<1228:FSOSAN>2.0.ZU;2-7
Abstract
Electron field-emission measurements of carbon films prepared by pulsed-las er deposition (PLD) and hot-filament chemical-vapor deposition (HF-CVD) are reported. Smooth PLD carbon films, with both high- and low-sp(3) contents, appear to be poor field emitters. In contrast, HF-CVD carbon exhibits very good field-emission properties, including the emission turn-on field as lo w as 9 V/mu m, high emission site density, and excellent durability. In add ition, HF-CVD was carried out at temperatures below 600 degrees C, compatib le with the use of glass substrates. The promising field-emission propertie s of HF-CVD carbon are attributed to the nanostructured nature of this mate rial. (C) 1999 American Institute of Physics. [S0003-6951(99)02235-4].