Ultra-high-finesse IV-VI microcavities for the midinfrared

Citation
T. Schwarzl et al., Ultra-high-finesse IV-VI microcavities for the midinfrared, APPL PHYS L, 75(9), 1999, pp. 1246-1248
Citations number
21
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
75
Issue
9
Year of publication
1999
Pages
1246 - 1248
Database
ISI
SICI code
0003-6951(19990830)75:9<1246:UIMFTM>2.0.ZU;2-6
Abstract
IV-VI semiconductor-based midinfrared microcavities with very high-quality factors were grown by molecular-beam epitaxy. The structures consist of PbT e/EuTe Bragg mirrors with three to five layer pairs rendering reflectivitie s in excess of 99.7%. The PbTe resonator layer between the reflectors has a n optical length of lambda/2, which yields a first-order cavity. The transm ission spectra of the microcavities show a very narrow Lorentzian-shaped Fa bry-Perot resonance at 1877 cm(-1) (lambda=5.32 mu m) with a full width at half maximum of 0.63 cm(-1) 78 mu eV. This corresponds to an ultrahigh effe ctive cavity finesse of 1700. (C) 1999 American Institute of Physics. [S000 3-6951(99)01235-8].