Temperature dependence of the reversal mechanism in spin-valve films

Citation
X. Portier et al., Temperature dependence of the reversal mechanism in spin-valve films, APPL PHYS L, 75(9), 1999, pp. 1290-1292
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
75
Issue
9
Year of publication
1999
Pages
1290 - 1292
Database
ISI
SICI code
0003-6951(19990830)75:9<1290:TDOTRM>2.0.ZU;2-8
Abstract
The thermal behavior of spin valves (SVs) and exchange-coupled films has be en investigated by in situ experiments in a Lorentz microscope. In situ mag netizing combined with in situ heating experiments have been performed duri ng observation of the magnetization reversal of SV materials. A clear demon stration of the thermal effect on the reversal of the free layer is shown a s well as a decrease of the exchange-bias pinning with increasing temperatu re. This latter effect results in the switching of the pinned layer near th e blocking temperature. (C) 1999 American Institute of Physics. [S0003-6951 (99)02135-X].