Atomic force microscopy phase imaging of conductive polymer blends with ultralow percolation threshold

Authors
Planes, J Samson, Y Cheguettine, Y
Citation
J. Planes et al., Atomic force microscopy phase imaging of conductive polymer blends with ultralow percolation threshold, APPL PHYS L, 75(10), 1999, pp. 1395-1397
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
75
Issue
10
Year of publication
1999
Pages
1395 - 1397
Database
ISI
SICI code
0003-6951(19990906)75:10<1395:AFMPIO>2.0.ZU;2-2
Abstract
Tapping-mode atomic force microscopy is used to image the conducting networ k of polyaniline inside organic blends. The greater stiffness of the conduc ting polymer phase with respect to the matrix leads to good resolution phas e contrast imaging. Cross-section images provide a unique insight in the di stribution of the conductive phase within the matrix. (C) 1999 American Ins titute of Physics. [S0003-6951(99)04336-3].