Synthesizing testable combinational circuits

It is advisable to synthesize combinational circuits with regard for-their testability - for example, with regard for the existence of a simple proced ure for constructing a sufficiently short full checking test, that is, a te st detecting all multiple stuck-at-1(0) failures at the terminals of circui t elements. It is proved that if a combinational circuit is synthesized fro m the irredundant System of disjunctive normal forms using factorization me thods, then a simple procedure, for constructing a full test can be obtaine d for it. The length of the test is equal at;most to the stem of the ranks of the conjunctions of the irredundant system of disjunctive normal forms p lus Me sum of the powers of the characteristics of conjunctions of this sys tem.