We present a simple method to introduce corrugation into jellium-type model
s for metal surfaces. As our reference we take a one-dimensional system tha
t is homogeneous parallel to the surface, and expand the density functional
in the three-dimensional correction. By choosing a suitable family of tria
l functions we calculate the corrugation up to second order in the perturba
tion. Our results compare well with calculations based on a full three-dime
nsional treatment. An application to charged surfaces suggests that the ele
ctronic corrugation is larger for a positively than for a negatively charge
d surface. Our method should be particularly useful in the modeling of comp
lex interfaces. (C) 1999 Elsevier Science B.V. All rights reserved.