In spite of their outstanding transport characteristics, InP high-electron
mobility transistors (HEMT's) deliver lower output power than GaAs pseudomo
rphic HEMT's (PHEMT's) throughout most of the millimeter-wave regime, Howev
er, the superior power-added efficiency of InP HEMT's when compared with Ga
As PHEMT's makes this technology attractive for many applications. The reas
on for the relatively inferior power output of InP HEMT's lies in their com
paratively small off-state and on-state breakdown voltages, This paper revi
ews the state of knowledge regarding the physics of breakdown voltage in In
P HEMT's, placing it in contrast with GaAs PHEMT's, It also presents curren
t understanding regarding burnout, a closely related phenomenon. This paper
concludes by discussing strategies for improving the breakdown voltage and
the power output of InP HEMT's.