A 40-gb/s integrated clock and data recovery circuit in a 50-GHz f(T) silicon bipolar technology

Citation
M. Wurzer et al., A 40-gb/s integrated clock and data recovery circuit in a 50-GHz f(T) silicon bipolar technology, IEEE J SOLI, 34(9), 1999, pp. 1320-1324
Citations number
14
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE JOURNAL OF SOLID-STATE CIRCUITS
ISSN journal
00189200 → ACNP
Volume
34
Issue
9
Year of publication
1999
Pages
1320 - 1324
Database
ISI
SICI code
0018-9200(199909)34:9<1320:A4ICAD>2.0.ZU;2-N
Abstract
Clock and data recovery (CDR) circuits are key electronic components in fut ure optical broadband communication systems. In this paper, we present a 40 -Gb/s integrated CDR circuit applying a phase-locked loop technique. The IC has been fabricated in a 50-GHz f(T) self-aligned double-polysilicon bipol ar technology using only production-like process steps. The achieved data r ate is a record value for silicon and comparable with the best results for this type of circuit realized in Sice and III-V technologies.