Growth of Ge-rich SixGe1-x single crystal with uniform composition (x=0.02) on a compositionally graded crystal for use as GaAs solar cells

Citation
K. Nakajima et al., Growth of Ge-rich SixGe1-x single crystal with uniform composition (x=0.02) on a compositionally graded crystal for use as GaAs solar cells, J CRYST GR, 205(3), 1999, pp. 270-276
Citations number
12
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF CRYSTAL GROWTH
ISSN journal
00220248 → ACNP
Volume
205
Issue
3
Year of publication
1999
Pages
270 - 276
Database
ISI
SICI code
0022-0248(199908)205:3<270:GOGSSC>2.0.ZU;2-H
Abstract
An improved growth technology was developed to grow Ge-rich SiGe crystals o n Ge seeds on the basis of the Multi-component zone melting method. The pur pose of growing such a crystal is the preparation of exactly lattice-matche d GaAs/SiGe heterostructures for higher-efficiency tandem cells than GaAs/G e cells. In this method, Si solute elements are continuously supplied from the Si source crystal, and the compositional profile in the SiGe crystal is controlled by the pulling rate. We were successful in preparing a SixGe1-x single crystal with a uniform composition (x = 0.02) following a graded co mposition (from x = 0 to 0.02). The size of the uniform crystal is 2 cm in length and 1.5 cm in diameter. The combined structure of uniform SiGe/grade d SiGe/Ge has two expected merits. A lattice-matched GaAs epitaxial layer c an be grown on the SiGe uniform crystal, and the graded composition from Ge (x = 0) to uniform SiGe (x = 0.02) widens the range of absorbed wavelength s of the solar spectrum. (C) 1999 Elsevier Science B.V. All rights reserved .