Growth defects in flux grown RbTiOAsO4 crystals observed with white-beam synchrotron radiation topography

The growth defects in flux grown RbTiOAsO4 crystal have been investigated b y white-beam synchrotron radiation topography. It is found that growth sect or boundaries are the primary growth defects and they show strong X-ray kin ematical contrast in the topograph. All the dislocations are growth induced and appear only in the near capping region. The area away from the capping region is nearly dislocation free. Growth bands show weak contrast in the X-ray topograph. which implies that the impurity contents are relatively lo w in various growth sectors and each growth sector is uniform in compositio n. (C) 1999 Elsevier Science B.V. All rights reserved.