S. Moriguchi et al., Measurement of and compensation for the difference between voltage and current centres in HRTEM, J ELEC MICR, 48(4), 1999, pp. 437-441
Either a voltage or a current centre is used to find the axis of a transmis
sion electron microscope so that a lens axis adjustment can be performed. T
he two centres are Plot strictly coincident with each other, although the c
oincidence of them is desirable. Therefore, in practice, either centre can
be used. The voltage centre is usually adopted for adjusting the lens axis.
The distance between the voltage and current centres of a high-resolution
transmission electron microscope has been measured in this study. We propos
e a method for compensating for the difference between the voltage and curr
ent centres which permits both centres to be set simultaneously to the opti
cal axis.