Measurement of and compensation for the difference between voltage and current centres in HRTEM

Citation
S. Moriguchi et al., Measurement of and compensation for the difference between voltage and current centres in HRTEM, J ELEC MICR, 48(4), 1999, pp. 437-441
Citations number
9
Categorie Soggetti
Multidisciplinary
Journal title
JOURNAL OF ELECTRON MICROSCOPY
ISSN journal
00220744 → ACNP
Volume
48
Issue
4
Year of publication
1999
Pages
437 - 441
Database
ISI
SICI code
0022-0744(1999)48:4<437:MOACFT>2.0.ZU;2-H
Abstract
Either a voltage or a current centre is used to find the axis of a transmis sion electron microscope so that a lens axis adjustment can be performed. T he two centres are Plot strictly coincident with each other, although the c oincidence of them is desirable. Therefore, in practice, either centre can be used. The voltage centre is usually adopted for adjusting the lens axis. The distance between the voltage and current centres of a high-resolution transmission electron microscope has been measured in this study. We propos e a method for compensating for the difference between the voltage and curr ent centres which permits both centres to be set simultaneously to the opti cal axis.