Combined ultramicrotomy for AFM and TEM using a novel sample holder

A new sample holder that allows combined microtomy for atomic force microsc opy (APM) and transmission electron microscopy (TEM) is described. The main feature of this sample holder is a small central part holding the sample. This central part fits into the head of an atomic force microscope. AFM mea surements can be performed with a sample mounted in this central part of th e sample holder. This makes the alignment of a microtomed built: sample unn ecessary, and offers the opportunity of an easy and fast combined sample pr eparation for AFM and TEM.