The solid state amorphous carbon films have been deposited by the method of
plasma enhanced chemical vapor deposition (PECVD). The structural features
have been characterized using FT-IR spectroscopy, Raman scattering, and I-
V measurement. The film is considered to be composed of microcrystalline di
amond domains and graphite-like carbon domains, which are interconnected by
hydrogenated sp(3) tetrahedral carbons. In I-V measurement, the sudden inc
rease of current at a certain critical voltage has been observed and this p
henomenon is understood to be due to the effect of charge tunneling through
carbon mesh between graphite-like domains. (C) 1999 Elsevier Science S.A.
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