Authors
Citation
S. Milita et al., Coherent X-ray imaging investigation of macrodefects and micropipes on SiC, MAT SCI E B, 61-2, 1999, pp. 63-67
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
ISSN journal
09215107
→ ACNP
Volume
61-2
Year of publication
1999
Pages
63 - 67
Database
ISI
SICI code
0921-5107(19990730)61-2:<63:CXIIOM>2.0.ZU;2-F
Abstract
We describe an X-ray phase imaging technique able to detect micro and macro
defects on SIG. This technique enables investigation of thick samples, not
accessible to light transmission microscopy and provides additional informa
tion on the defects. (C) 1999 Elsevier Science S.A. All rights reserved.