A mechanistic model for the oxidation of SiC is presented. The model explai
ns the observed anisotropic oxidation rate of SIC in terms of the effect of
weakening/strengthening of SI-C bonds arising from the on-going incorporat
ion of highly electronegative oxygen atoms into the crystal lattice. A nove
l Monte Carlo based oxidation simulator, OXYSIM, is presented and used to e
xplore the proposed SiC oxidation model. The extraction of key process metr
ics (such as oxide thickness, interface roughness and oxide defect density)
is discussed. (C) 1999 Elsevier Science S.A. All rights reserved.