A new approach for overcoming the problems of the heteroepitaxial beta-SiC
growth on Si substrates is hereby proposed. Namely, the surfactant effect i
s investigated by using Ge as adsorbate. The better control of the Si-surfa
ce conversion to SIC is targeted (conversion process). A structure is propo
sed taking into account eventual incorporation of the Ge in the SiC lattice
. The growth experiments towards the proposed structure were performed by s
olid source MBE and the grown samples were ex-situ characterized by atomic
force microscopy (AFM). In all cases, a clear difference between samples gr
own with and without the Ge adsorbate layer is observed. (C) 1999 Elsevier
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