Investigation of porous silicon as a new compliant substrate for hetero-epi
taxial deposition of 3C-SiC on silicon has been performed. The resulting la
yer has been analyzed in terms of X-ray diffraction, infrared reflectivity,
micro-Raman scattering and low temperature photoluminescence experiments.
From the results, intermediate properties between 3C-SiC deposited on bulk
silicon and 3C-SiC deposited on SIMOX have been found. (C) 1999 Elsevier Sc
ience S.A. All rights reserved.