Liquid phase silylation of a bilayer resist system

Authors
Citation
J. Hargreaves, Liquid phase silylation of a bilayer resist system, MICROEL ENG, 45(4), 1999, pp. 329-349
Citations number
27
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONIC ENGINEERING
ISSN journal
01679317 → ACNP
Volume
45
Issue
4
Year of publication
1999
Pages
329 - 349
Database
ISI
SICI code
0167-9317(199908)45:4<329:LPSOAB>2.0.ZU;2-#
Abstract
0.35 mu m packed and 0.20 mu m isolated features have been printed with a p ositive acting top-surface imaging process. The process consists of a bilay er resist scheme, the top layer of which is a chemically amplified negative resist. The latter, after exposure and post-exposure bake, is silylated in the liquid phase and the latent positive images are resolved using an oxyg en plasma etch. (C) 1999 Elsevier Science BN. All rights reserved.