Ey. Lee, Thermoelectric voltage spectroscopy for studying compensation in semi-insulating wide energy band gap materials, SOL ST COMM, 112(1), 1999, pp. 31-34
A new method, thermoelectric voltage spectroscopy (TEVS), is demonstrated f
or the study of deep levels and compensation. Thermally stimulated conducti
vity (TSC) and thermoelectric emission spectroscopy (TEES) results are also
shown for comparison. In TEVS, the thermoelectric voltage across a sample
is measured as a function of the temperature, during the thermal stimulatio
n of electron and hole traps. The TEVS voltage shows steps that reflect (1)
the change of the electron and hole quasi-Fermi levels due to detrapping a
nd (2) the trap type, whether electron or hole. A simple product rule holds
between the TEVS voltage, TSC current, and TEES current, when identical tr
ap filling and heating are done. The combination of TSC and TEVS is a power
ful way for studying compensation and deep levels in semi-insulating wide e
nergy band gap materials. (C) 1999 Elsevier Science Ltd. All rights reserve
d.