Surface analysis techniques, including x-ray photoelectron spectroscopy wit
h small-spot analysis (down to 100 mu m(2)) capabilities, field emission sc
anning Auger microscopy, electron energy-loss spectroscopy in association w
ith these two techniques and micro-Raman spectroscopy, have been used to co
llect surface information on specific facets of commercially available subm
illimetre-sized cubic boron nitride (cBN) crystals. With the freedom of cho
osing a specific Facet with a known orientation relative to the probing bea
m and detector, it is possible to obtain accurate information on the surfac
e compositional structure of a cBN crystal before and after a surface react
ion. Copyright (C) 1999 John Wiley & Sons, Ltd.