Surface top-layer analysis by positron annihilation induced Auger electronspectroscopy

Authors
Ohdaira, T Suzuki, R Mikado, T
Citation
T. Ohdaira et al., Surface top-layer analysis by positron annihilation induced Auger electronspectroscopy, SURF SCI, 435, 1999, pp. 239-243
Citations number
17
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
435
Year of publication
1999
Pages
239 - 243
Database
ISI
SICI code
0039-6028(19990802)435:<239:STABPA>2.0.ZU;2-E
Abstract
We have developed an apparatus for time-of-flight positron annihilation ind uced Auger electron spectroscopy (TOF-PAES) at an intense, slow positron be amline of the Electrotechnical Laboratory. We carried out TOF-PAES analysis for the adsorption of oxygen on Si(100). The results demonstrate that PAES can yield useful and unique information on adsorbates on top of surfaces. (C) 1999 Elsevier Science B.V. All rights reserved.