The Ni(100)(2 x 2)p4g-N reconstruction determined by surface X-ray diffraction

Authors
Dudzik, E Norris, AG McGrath, R Charlton, G Thornton, G Murphy, B Turner, TS Norman, D
Citation
E. Dudzik et al., The Ni(100)(2 x 2)p4g-N reconstruction determined by surface X-ray diffraction, SURF SCI, 435, 1999, pp. 317-321
Citations number
23
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
435
Year of publication
1999
Pages
317 - 321
Database
ISI
SICI code
0039-6028(19990802)435:<317:TNX2RD>2.0.ZU;2-V
Abstract
The 'clock' reconstruction of the Ni(100)(2 x 2)p4g-N system has been measu red using surface X-ray diffraction. An in-plane displacement of the surfac e layer Ni atoms of d(xy) = 0.30 +/- 0.01 Angstrom was found. This value is smaller than that measured for this system using photoelectron diffraction (PED) and surface extended X-ray absorption fine structure (SEXAFS). Possi ble reasons for this are discussed. (C) 1999 Elsevier Science B.V. All righ ts reserved.