Ge/Bi/Si(001)-c(4 x 2) interface studied by high-resolution core-level spectroscopy

Citation
P. De Padova et al., Ge/Bi/Si(001)-c(4 x 2) interface studied by high-resolution core-level spectroscopy, SURF SCI, 435, 1999, pp. 362-366
Citations number
21
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
435
Year of publication
1999
Pages
362 - 366
Database
ISI
SICI code
0039-6028(19990802)435:<362:GX2ISB>2.0.ZU;2-T
Abstract
The adsorption of germanium on the Bi/Si(001)-(2 x 5) surface [bismuth satu ration coverage of 0.7 ML (monolayers)] was investigated by core-level phot oemission spectroscopy. At submonolayer germanium coverage, the presence of a bulk component largely dominating the Ge 3d core level demonstrates that the favourite adsorption sites are the bismuth-terminated terraces. where Ge-Bi site exchange takes place. At larger germanium coverage, in addition to the previous process, the occurrence of a purr germanium epitaxy is indi cated by the presence of the (2 x 1) surface components in the Ge 3d core l evel. (C) 1999 Elsevier Science B.V. All rights reserved.